Title :
High Power and High Isolation 2 to 20 Ghz Mmic Switches
Author :
Tsukii, T. ; SchindIer, M.J. ; Houng, S.G.
Author_Institution :
Raytheon Company, Research Division, MA
Keywords :
Breakdown voltage; Double-gate FETs; Identity-based encryption; Iron; MMICs; Plasma measurements; Power generation; Radio frequency; Switches; Wideband;
Conference_Titel :
Microwave Conference, 1992. APMC 92. 1992 Asia-Pacific
Conference_Location :
Adelaide, South Australia
Print_ISBN :
0-7803-0549-3
DOI :
10.1109/APMC.1992.672046
