Title :
Benchmarks For Microprocessors
Author :
Fronek, D.K. ; Sader, Ibrahim
Author_Institution :
University Of Nevada-reno
Keywords :
Arithmetic; Automatic testing; Benchmark testing; Circuit testing; Clocks; Costs; Frequency; Guidelines; Logic functions; Microprocessors;
Conference_Titel :
Southeastcon '81. Conference Proceedings
Conference_Location :
Huntsville, AL, USA
DOI :
10.1109/SECON.1981.673543
