Title :
Advanced WIP control for make-to-order wafer fabrication
Author :
Sturm, Roland ; Frauenhoffer, Frank ; Dorner, Johann ; Kirschenhofer, Oliver ; Reisinger, Thomas
Author_Institution :
Dept. of Cleanroom Manuf., Fraunhofer Inst. Manuf. Eng. & Autom., Stuttgart, Germany
Abstract :
This paper gives an overview of advanced scheduling and dispatching policies for WIP (work in process) management within the wafer fabrication process. Additionally, the pros and cons of general WIP control philosophies are opposed. Several control policies are evaluated for the application in complex make-to-order environment such as ASIC production. Based on the real shop floor environment of Philips SMST and the currently used control policies a proposal is presented answering the following two questions: what are the requirements of tomorrow´s WIP control systems applied in make-to-order wafer fabrication; and how can these control policies be implemented and introduced on the shop floor using existing WIP control and scheduling systems?
Keywords :
application specific integrated circuits; dispatching; integrated circuit manufacture; production control; ASIC production; Philips SMST; WIP control; complex make-to-order environment; control policies; dispatching policies; make-to-order wafer fabrication; real shop floor environment; scheduling; wafer fabrication process; work in process management; Application specific integrated circuits; Control systems; Dispatching; Fabrication; Job shop scheduling; Manufacturing automation; Manufacturing processes; Production; Semiconductor device manufacture; Uncertainty;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1999 IEEE/SEMI
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-5217-3
DOI :
10.1109/ASMC.1999.798176