DocumentCode :
3231067
Title :
Cycle time and bottleneck analysis
Author :
Laure, Walter
Author_Institution :
Infineon Technol., Villach, Austria
fYear :
1999
fDate :
1999
Firstpage :
42
Lastpage :
47
Abstract :
This report shows how with a small investment in software development a purposeful cycle time and bottleneck analysis can be made possible in the production management system of a semiconductor fab. Cycle time violation of individual products, which are of great significance with large product mixes, can be quickly recognised. Equipment throughput analysis can be systematically performed allowing targeted response to weak points
Keywords :
integrated circuit manufacture; production engineering computing; bottleneck analysis; cycle time; equipment throughput; production management; semiconductor fab; software development; Current measurement; Data processing; Databases; Displays; Graphics; Performance analysis; Production management; Throughput; Time measurement; Time series analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1999 IEEE/SEMI
Conference_Location :
Boston, MA
ISSN :
1078-8743
Print_ISBN :
0-7803-5217-3
Type :
conf
DOI :
10.1109/ASMC.1999.798179
Filename :
798179
Link To Document :
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