• DocumentCode
    3231067
  • Title

    Cycle time and bottleneck analysis

  • Author

    Laure, Walter

  • Author_Institution
    Infineon Technol., Villach, Austria
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    42
  • Lastpage
    47
  • Abstract
    This report shows how with a small investment in software development a purposeful cycle time and bottleneck analysis can be made possible in the production management system of a semiconductor fab. Cycle time violation of individual products, which are of great significance with large product mixes, can be quickly recognised. Equipment throughput analysis can be systematically performed allowing targeted response to weak points
  • Keywords
    integrated circuit manufacture; production engineering computing; bottleneck analysis; cycle time; equipment throughput; production management; semiconductor fab; software development; Current measurement; Data processing; Databases; Displays; Graphics; Performance analysis; Production management; Throughput; Time measurement; Time series analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 1999 IEEE/SEMI
  • Conference_Location
    Boston, MA
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-5217-3
  • Type

    conf

  • DOI
    10.1109/ASMC.1999.798179
  • Filename
    798179