Title :
Suppression mechanism of transverse-mode spurious responses in SAW resonators on a SiO2/Al/LiNbO3 structure
Author :
Nakamura, H. ; Nakanishi, H. ; Goto, R. ; Hashimoto, K.
Author_Institution :
Corp. Components Dev. Div., Panasonic Electron. Devices Co., Ltd., Kadoma, Japan
Abstract :
The transverse-mode spurious responses could be suppressed successfully by the selectively SiO2 removal at the dummy region. This paper discusses the suppression mechanism of the transverse-mode spurious responses by the selectively SiO2 removal technique. The SAW field distribution was analyzed for the SiO2/Al/LiNbO3 structure. The field analysis indicated that the selectively SiO2 removalenhances the SAW reflection coefficient at the boundary between the interdigital and the dummy electrode regions. When the SiO2 thickness is large, full SiO2 removal from the dummy electrode region creates another transverse mode resonance. The laser probe observation revealed that it is due to the hybrid mode caused by the coupling of the SH SAW with the Rayleigh SAW at the lateral boundaries. It was also shown that the response can be suppressed by the partial SiO2 removal from the dummy electrode region. This might be explained by the weakened mutual coupling between the SH and Rayleigh SAWs at the lateral boundaries. This weakening is caused by the reduction of the SAW velocity difference between the dummy electrode and IDT regions.
Keywords :
Rayleigh waves; acoustic field; acoustic resonance; acoustic wave reflection; aluminium; lithium compounds; silicon compounds; surface acoustic wave resonators; Rayleigh SAW; SAW field distribution; SAW reflection coefficient; SAW resonators; SH SAW; SiO2-Al-LiNbO3; dummy electrode; field analysis; hybrid mode; interdigital electrode; laser probe; lateral boundaries; mutual coupling; partial removal; selectively removal technique; suppression mechanism; transverse mode resonance; transverse-mode spurious responses; Electrodes; Lithium niobate; Probes; Substrates; Surface acoustic waves; Temperature; SAW resonator; SiO2/Al/LiNbO3 structure; selective SiO2 removal; transverse-mode spurious response;
Conference_Titel :
Ultrasonics Symposium (IUS), 2011 IEEE International
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4577-1253-1
DOI :
10.1109/ULTSYM.2011.0131