Title :
A novel computerized multiharmonic active load-pull system for the optimization of high efficiency operating classes in power transistors
Author :
Blache, F. ; Nebus, J.M. ; Bouysse, Philippe ; Villotte, J.P.
Author_Institution :
IRCOM, Limoges Univ., France
Abstract :
A fully automated multiharmonic load-pull system allowing accurate measurement and control of the first three harmonic load terminations of RF and microwave transistors is presented in this paper. The technical originality of the proposed system lies in that the first, second and third harmonic load terminations can be independently and automatically monitored and fixed while varying the input power driving the transistor at the fundamental frequency. Appropriate hardware and software allow fast and automatic plots of power/efficiency performances of DUTs versus input power for different harmonic loadings. To demonstrate an attractive application of the system, measurements of a 1800 /spl mu/m gate periphery MESFET at 1.8 GHz for mobile communication applications are presented. Both suitable harmonic load terminations and nonappropriate ones yielding respectively optimum and poor power added efficiency are given.<>
Keywords :
UHF measurement; UHF transistors; automatic test equipment; harmonics; microwave measurement; microwave power transistors; power transistors; semiconductor device testing; MESFET; RF transistors; computerized multiharmonic active load-pull system; harmonic load terminations; high efficiency operating classes; microwave transistors; optimization; power transistors; power/efficiency performances; Application software; Automatic control; Computerized monitoring; Control systems; Hardware; Microwave measurements; Microwave transistors; Power system harmonics; Radio frequency; Software performance;
Conference_Titel :
Microwave Symposium Digest, 1995., IEEE MTT-S International
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-2581-8
DOI :
10.1109/MWSYM.1995.406149
