A spectrally-tunable photocurrent microscope for characterizing nanoelectronic devices

Author

DeBorde, Tristan ; Kevek, Joshua W. ; Sharf, Tal ; Wardini, Jenna L. ; Minot, Ethan D.

Author_Institution

Dept. of Phys., Oregon State Univ., Corvallis, OR, USA

fYear

2011

fDate

15-18 Aug. 2011

Firstpage

382

Lastpage

386

Abstract

Scanning photocurrent microscopy is a unique tool that facilitates both device characterization and the study of fundamental properties of optoelectronic nanomaterials. We have built a scanning photocurrent microscope that incorporates a super continuum laser as the light source. The microscope illuminates nanoelectronic devices with a micron-scale light spot and a photon energy that is tunable from 0.67 eV to 2.7 eV. We describe the design of our microscope and present measurements of carbon nanotube transistor devices. These measurements highlight the features of our microscope, particularly the advantages of combining spatial and spectral resolution when characterizing nanoelectronic devices.

Keywords

atomic force microscopy; carbon nanotube field effect transistors; carbon nanotubes; electron microscopes; nanoelectromechanical devices; photoconductivity; photodiodes; photoemission; carbon nanotube transistor device; electron volt energy 0.67 eV to 2.7 eV; light source; micron-scale light spot; nanoelectronic device; optoelectronic nanomaterials; photon energy; scanning photocurrent microscopy; spectrally-tunable photocurrent microscope; super continuum laser; Carbon nanotubes; FETs; Light sources; Microscopy; Photoconductivity; Reflection; Photocurrent; carbon nanotube; field-effect transistor;

fLanguage

English

Publisher

ieee

Conference_Titel

Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on

Conference_Location

Portland, OR

ISSN

1944-9399

Print_ISBN

978-1-4577-1514-3

Electronic_ISBN

1944-9399

Type

conf

DOI

10.1109/NANO.2011.6144644

Filename

6144644