Title :
A spectrally-tunable photocurrent microscope for characterizing nanoelectronic devices
Author :
DeBorde, Tristan ; Kevek, Joshua W. ; Sharf, Tal ; Wardini, Jenna L. ; Minot, Ethan D.
Author_Institution :
Dept. of Phys., Oregon State Univ., Corvallis, OR, USA
Abstract :
Scanning photocurrent microscopy is a unique tool that facilitates both device characterization and the study of fundamental properties of optoelectronic nanomaterials. We have built a scanning photocurrent microscope that incorporates a super continuum laser as the light source. The microscope illuminates nanoelectronic devices with a micron-scale light spot and a photon energy that is tunable from 0.67 eV to 2.7 eV. We describe the design of our microscope and present measurements of carbon nanotube transistor devices. These measurements highlight the features of our microscope, particularly the advantages of combining spatial and spectral resolution when characterizing nanoelectronic devices.
Keywords :
atomic force microscopy; carbon nanotube field effect transistors; carbon nanotubes; electron microscopes; nanoelectromechanical devices; photoconductivity; photodiodes; photoemission; carbon nanotube transistor device; electron volt energy 0.67 eV to 2.7 eV; light source; micron-scale light spot; nanoelectronic device; optoelectronic nanomaterials; photon energy; scanning photocurrent microscopy; spectrally-tunable photocurrent microscope; super continuum laser; Carbon nanotubes; FETs; Light sources; Microscopy; Photoconductivity; Reflection; Photocurrent; carbon nanotube; field-effect transistor;
Conference_Titel :
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4577-1514-3
Electronic_ISBN :
1944-9399
DOI :
10.1109/NANO.2011.6144644
