Title :
Parameter inversion of layered media covered by a rough surface
Author :
Lin, Z.W. ; Xu, X. ; Zhang, X.J. ; Fang, G.Y.
Author_Institution :
Key Lab. of Electromagn. Radiat. & Detection Technol., Chinese Acad. of Sci., Beijing, China
Abstract :
An inversion technique for estimating the structure parameters of layered media covered by a rough surface based on a genetic algorithm is proposed in this work. A theoretical model of scattering from three-dimensional arbitrary layered media with a 3D infinite rough surface based on the small perturbation method (SPM) is employed to calculate the forward scattering problem. The backscatting coefficients of multiple frequencies, angles and polarizations are used to create a nonlinear optimization problem. As the cost function has many local minima, a genetic algorithm is applied to help the inversion procedure converge to the global minimum. The inversion results show the method poses good tolerance to the input data with the additive white Gaussian noise.
Keywords :
AWGN; electromagnetic wave scattering; genetic algorithms; perturbation techniques; rough surfaces; 3D infinite rough surface; additive white Gaussian noise; cost function; forward scattering problem; genetic algorithm; inversion technique; layered media; nonlinear optimization problem; parameter inversion; small perturbation method; structure parameter estimation; three-dimensional arbitrary layered media; Frequency; Genetic algorithms; Nonhomogeneous media; Parameter estimation; Perturbation methods; Polarization; Rough surfaces; Scanning probe microscopy; Scattering; Surface roughness;
Conference_Titel :
Microwave and Millimeter Wave Technology (ICMMT), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5705-2
DOI :
10.1109/ICMMT.2010.5524921