DocumentCode :
3231099
Title :
A new low energy BIST using a statistical code
Author :
Chun, Sunghoon ; Kim, Taejin ; Kan, Sungho
Author_Institution :
Yonsei Univ., Seoul
fYear :
2008
fDate :
21-24 March 2008
Firstpage :
647
Lastpage :
652
Abstract :
To tackle with the increased switching activity during the test operation, this paper proposes a new built-in self test (BIST) scheme for low energy testing that uses a statistical code and a new technique to skip unnecessary test sequences. From a general point of view, the goal of this technique is to minimize the total power consumption during a test and to allow the at-speed test in order to achieve high fault coverage. The effectiveness of the proposed low energy BIST scheme was validated on a set of ISC AS ´89 benchmark circuits with respect to test data volume and energy saving.
Keywords :
VLSI; built-in self test; integrated circuit testing; low-power electronics; statistical analysis; ISC AS 89 benchmark circuits; VLSI; built-in self test; energy saving; low energy BIST; power consumption; statistical code; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Electronic equipment testing; Energy consumption; Power generation; Semiconductor device modeling; Test pattern generators; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2008. ASPDAC 2008. Asia and South Pacific
Conference_Location :
Seoul
Print_ISBN :
978-1-4244-1921-0
Electronic_ISBN :
978-1-4244-1922-7
Type :
conf
DOI :
10.1109/ASPDAC.2008.4484031
Filename :
4484031
Link To Document :
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