Title :
Modeling of large signal device/circuit interactions
Author :
Grubin, H.L. ; Kreskovsky, J.P. ; Levy, R.
Author_Institution :
Sci. Res. Assoc. Inc., Glastonbury, CT, USA
Abstract :
The feasibility of using a physically based research algorithm to generate the coefficients for a nonlinear, equivalent-circuit model of an FET is demonstrated. The coefficients of the ordinary differential equations (ODES) representing the device are determined numerically using a model based on the drift and diffusion equations. The resulting ODE representation is then executed, and the validity of the results are verified, at select bias points, by performing accurate transient drift and diffusion simulations for steady AC operation into a simple resistive load. The comparison gives some degree of confidence in the equivalent-circuit model. However, it is stressed that the equivalent-circuit results must always be regarded as preliminary. It is always necessary to verify them against physical models and against experiments
Keywords :
equivalent circuits; field effect transistors; nonlinear differential equations; numerical methods; semiconductor device models; FET; diffusion equations; drift equation; large signal device/circuit interactions; nonlinear equivalent circuit model; numerical determination; ordinary differential equations; physically based research algorithm; resistive load; steady AC operation; transient diffusion simulation; transient drift; Admittance; Circuit simulation; Circuit testing; Equations; Equivalent circuits; Frequency; Numerical simulation; Performance evaluation; RLC circuits; Semiconductor devices;
Conference_Titel :
High Speed Semiconductor Devices and Circuits, 1989. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
Conference_Location :
Ithaca, NY
DOI :
10.1109/CORNEL.1989.79819