Title :
Techniques for analyzing cycle time variability in fab and probe
Author :
Sattler, Linda ; O´Connor, Sheila ; Hallinan, Maureen ; Finucane, Tom
Author_Institution :
Nat. Microelectron. Res. Centre, Univ. Coll. Cork, Ireland
Abstract :
Reducing cycle time variability between fab and probe requires first an assessment of where the problems lie. Potential solutions may create new problems. In this paper we show techniques-metrics and statistics-that were used at Analog Devices in a systematic fashion to isolate the biggest areas for improvement and increase lead time reliability
Keywords :
integrated circuit manufacture; reliability; statistical analysis; Analog Devices; IC fab issues; cycle time variability; lead time reliability; statistics; Data analysis; Educational institutions; Fabrication; Lead compounds; Lead time reduction; Microelectronics; Probes; Semiconductor device manufacture; Statistics; Testing;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1999 IEEE/SEMI
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-5217-3
DOI :
10.1109/ASMC.1999.798196
