Title :
Quick repairing of defects inside telescoping multi-walled carbon nanotubes using contact resistance
Author :
Nakajima, Masahiro ; Ode, Yasuhito ; Yang, Zhan ; Saito, Yahachi ; Fukuda, Toshio
Author_Institution :
Center For Micro-nano Mechatron., Nagoya Univ., Nagoya, Japan
Abstract :
This paper presents In situ quick repairing of defects inside a telescoping multi-walled carbon nanotubes (MWCNTs) using contact resistance. The defects were inserted and repaired by In situ nanomanipulation technique inside a transmission electron microscope (TEM). The defects were quickly (less than ~0.1 s) repaired by applying a current after contact with electrode. The repairing of defects was confirmed by bending phenomenon under applying forces though nanomanipulation. The proposed method can be used to control the mechanical and electrical properties of telescoping nanotube quickly for nano-devices applications such as nano-sensor, nano-actuator, and so on.
Keywords :
bending; carbon nanotubes; contact resistance; crystal defects; nanofabrication; transmission electron microscopy; C; TEM; bending phenomenon; contact resistance; defect repairing; electrical properties; electrode; in situ nanomanipulation technique; in situ quick repairing; mechanical properties; nanoactuator; nanodevices applications; nanosensor; telescoping multiwalled carbon nanotubes; transmission electron microscopy; Carbon nanotubes; Contact resistance; Contamination; Electrodes; Electron beams; Manipulators; Scanning electron microscopy;
Conference_Titel :
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4577-1514-3
Electronic_ISBN :
1944-9399
DOI :
10.1109/NANO.2011.6144662