DocumentCode
3231414
Title
Quick repairing of defects inside telescoping multi-walled carbon nanotubes using contact resistance
Author
Nakajima, Masahiro ; Ode, Yasuhito ; Yang, Zhan ; Saito, Yahachi ; Fukuda, Toshio
Author_Institution
Center For Micro-nano Mechatron., Nagoya Univ., Nagoya, Japan
fYear
2011
fDate
15-18 Aug. 2011
Firstpage
1070
Lastpage
1073
Abstract
This paper presents In situ quick repairing of defects inside a telescoping multi-walled carbon nanotubes (MWCNTs) using contact resistance. The defects were inserted and repaired by In situ nanomanipulation technique inside a transmission electron microscope (TEM). The defects were quickly (less than ~0.1 s) repaired by applying a current after contact with electrode. The repairing of defects was confirmed by bending phenomenon under applying forces though nanomanipulation. The proposed method can be used to control the mechanical and electrical properties of telescoping nanotube quickly for nano-devices applications such as nano-sensor, nano-actuator, and so on.
Keywords
bending; carbon nanotubes; contact resistance; crystal defects; nanofabrication; transmission electron microscopy; C; TEM; bending phenomenon; contact resistance; defect repairing; electrical properties; electrode; in situ nanomanipulation technique; in situ quick repairing; mechanical properties; nanoactuator; nanodevices applications; nanosensor; telescoping multiwalled carbon nanotubes; transmission electron microscopy; Carbon nanotubes; Contact resistance; Contamination; Electrodes; Electron beams; Manipulators; Scanning electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
Conference_Location
Portland, OR
ISSN
1944-9399
Print_ISBN
978-1-4577-1514-3
Electronic_ISBN
1944-9399
Type
conf
DOI
10.1109/NANO.2011.6144662
Filename
6144662
Link To Document