• DocumentCode
    3231414
  • Title

    Quick repairing of defects inside telescoping multi-walled carbon nanotubes using contact resistance

  • Author

    Nakajima, Masahiro ; Ode, Yasuhito ; Yang, Zhan ; Saito, Yahachi ; Fukuda, Toshio

  • Author_Institution
    Center For Micro-nano Mechatron., Nagoya Univ., Nagoya, Japan
  • fYear
    2011
  • fDate
    15-18 Aug. 2011
  • Firstpage
    1070
  • Lastpage
    1073
  • Abstract
    This paper presents In situ quick repairing of defects inside a telescoping multi-walled carbon nanotubes (MWCNTs) using contact resistance. The defects were inserted and repaired by In situ nanomanipulation technique inside a transmission electron microscope (TEM). The defects were quickly (less than ~0.1 s) repaired by applying a current after contact with electrode. The repairing of defects was confirmed by bending phenomenon under applying forces though nanomanipulation. The proposed method can be used to control the mechanical and electrical properties of telescoping nanotube quickly for nano-devices applications such as nano-sensor, nano-actuator, and so on.
  • Keywords
    bending; carbon nanotubes; contact resistance; crystal defects; nanofabrication; transmission electron microscopy; C; TEM; bending phenomenon; contact resistance; defect repairing; electrical properties; electrode; in situ nanomanipulation technique; in situ quick repairing; mechanical properties; nanoactuator; nanodevices applications; nanosensor; telescoping multiwalled carbon nanotubes; transmission electron microscopy; Carbon nanotubes; Contact resistance; Contamination; Electrodes; Electron beams; Manipulators; Scanning electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2011 11th IEEE Conference on
  • Conference_Location
    Portland, OR
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4577-1514-3
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2011.6144662
  • Filename
    6144662