• DocumentCode
    3231521
  • Title

    Over complementary MOS logic for don´t care conditions

  • Author

    Cheng, Shun-Wen

  • Author_Institution
    Dept. of Electron. Eng., Far East Univ., Tainan, Taiwan
  • fYear
    2010
  • fDate
    6-9 Dec. 2010
  • Firstpage
    700
  • Lastpage
    703
  • Abstract
    The propagation delay in CMOS gates strongly depends on the number of series PMOS and NMOS transistors in the pull-up and pull-down networks, respectively. Don´t care conditions are widely used for logic simplification. The PMOS block is built by the on-set (logic-1) and partial don´t-care terms; and then the NMOS block is constructed by the off-set (logic-0) and the remnant don´t-care terms. We don´t care what the output is to be the unused combination of the input variables because they are guaranteed never to happen. By the don´t-care conditions, this paper proposes an over-complementary MOS logic for circuit simplification. The key point of the over-complementary is that some don´t-care terms are selected by the PMOS and NMOS block simultaneously. Thus the circuit implementation can be further simplified. The proposed over-complementary MOS logic reduces the number of stacked PMOS and NMOS transistor, layout area cost, and junction capacitance. It also decreases power dissipation in normal condition. And the circuit is still working properly.
  • Keywords
    CMOS logic circuits; CMOS gate; NMOS block; NMOS transistor; PMOS transistor; circuit simplification; don´t care condition; logic simplification; logic-0; logic-1term; over complementary MOS logic; partial don´t-care term; pull-down network; pull-up network; remnant don´t-care term; CMOS integrated circuits; Decoding; Equations; Inverters; Layout; MOSFETs; VLSI; digital integrated circuit; don´t care condition; non-complementary MOS logic; switch theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (APCCAS), 2010 IEEE Asia Pacific Conference on
  • Conference_Location
    Kuala Lumpur
  • Print_ISBN
    978-1-4244-7454-7
  • Type

    conf

  • DOI
    10.1109/APCCAS.2010.5775000
  • Filename
    5775000