DocumentCode :
3231654
Title :
Impact of skew and jitter on the performance of VLSI interconnects
Author :
Khanna, Gargi ; Chandel, Rajeevan ; Chandel, Ashwani Kumar
Author_Institution :
E&CE Dept., NIT Hamirpur, Hamirpur, India
fYear :
2010
fDate :
6-9 Dec. 2010
Firstpage :
1223
Lastpage :
1226
Abstract :
The timing characteristics and performance of high-speed VLSI circuits is greatly dependent on the interconnects which distribute power, clock and signal to the entire chip. The delay, power dissipation and cross-talk are the major design constraints for high performance VLSI interconnects. These non-ideal effects are dependent on temperature and timing constraint viz. skew and jitter. This paper presents in depth analysis of skew and jitter variation on the performance of VLSI interconnects. It is shown that variations of skew, jitter and temperature change the behaviour of coupled interconnect lines under different switching patterns. Results are obtained using SPICE simulations for 130nm technology node.
Keywords :
SPICE; VLSI; circuit simulation; high-speed integrated circuits; integrated circuit interconnections; jitter; SPICE simulations; VLSI interconnects; coupled interconnect lines; cross-talk; delay; design constraints; high-speed VLSI circuits; jitter; nonideal effects; power dissipation; skew; switching patterns; temperature; timing characteristics; timing constraint; Delay; Integrated circuit interconnections; Integrated circuit modeling; Jitter; Power dissipation; Switches; Very large scale integration; Propagation delay; crosstalk; jitter; skew; thermal effects;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (APCCAS), 2010 IEEE Asia Pacific Conference on
Conference_Location :
Kuala Lumpur
Print_ISBN :
978-1-4244-7454-7
Type :
conf
DOI :
10.1109/APCCAS.2010.5775007
Filename :
5775007
Link To Document :
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