DocumentCode
3231693
Title
VEBoC: Variation and error-aware design for billions of devices on a chip
Author
Akram, Shoaib ; Cromar, Scott ; Lucas, Gregory ; Papakonstantinou, Alexandros ; Chen, Deming
Author_Institution
Univ. of Illinois, Urbana
fYear
2008
fDate
21-24 March 2008
Firstpage
803
Lastpage
808
Abstract
Billions of devices on a chip is around the corner and the trend of deep submicron (DSM) technology scaling will continue for at least another decade. Meanwhile, designers also face severe on-chip parameter variations, soft/hard errors, and high leakage power. How to use these billions of devices to deliver power-efficient, high-performance, and yet error-resilient computation is a challenging task. In this paper, we attempt to demonstrate some of our perspectives to address these critical issues. We elaborate on variation-aware synthesis, holistic error modeling, reliable multicore, and synthesis for application-specific multicore. We also present some of our insights for future reliable computing.
Keywords
integrated circuit design; system-on-chip; application-specific multicore; deep submicron technology; error-resilient computation; holistic error modeling; onchip parameter variations; soft-hard errors; variation-aware synthesis; Circuit synthesis; Computer errors; Design engineering; High level synthesis; Multicore processing; Power system modeling; Power system reliability; Productivity; System-on-a-chip; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2008. ASPDAC 2008. Asia and South Pacific
Conference_Location
Seoul
Print_ISBN
978-1-4244-1921-0
Electronic_ISBN
978-1-4244-1922-7
Type
conf
DOI
10.1109/ASPDAC.2008.4484062
Filename
4484062
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