DocumentCode :
3231781
Title :
Managing the negative impact of recipe diversity on wet process tools and capacity: a multi-fabricator model
Author :
Carpenter, Nicole ; Hilscher, David F.
Author_Institution :
Microelectron. Div., IBM Corp., Essex Junction, VT, USA
fYear :
1999
fDate :
1999
Firstpage :
168
Lastpage :
171
Abstract :
This paper describes the results of a multi-fabricator site team in minimizing recipe diversity; the metrics used to measure the progress of the team are also defined. By identifying and measuring the differences in recipe and process locations within a route, process changes were implemented to make the process operations more standard between various fabricators and the technologies at a given fabricator. This work has resulted in eliminating unnecessary cleans, minimizing differences between various technologies, eliminating chemistries used for only a few recipes, and propagating the best practices among the fabricators
Keywords :
batch processing (industrial); integrated circuit yield; manufacturing resources planning; semiconductor process modelling; surface cleaning; technology transfer; batching jobs for processing; capacity loss; cleaning; complex technology transfer; delays to market; engineering overhead; increased chemical usage; multi-fabricator model; negative impact; recipe diversity; standard process operations; wet process tools; Chemical processes; Chemical technology; Chemistry; Delay; Manufacturing processes; Microelectronics; Rivers; Routing; Semiconductor device manufacture; Technology transfer;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1999 IEEE/SEMI
Conference_Location :
Boston, MA
ISSN :
1078-8743
Print_ISBN :
0-7803-5217-3
Type :
conf
DOI :
10.1109/ASMC.1999.798214
Filename :
798214
Link To Document :
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