Title :
The effect of performance standards in a high volume wafer fab
Author :
Ingersoll, Tim ; Gentleman-Ingersoll, Jan ; Uszler, Pat
Author_Institution :
Semicond. Group, Texas Instrum. Inc., Dallas, TX, USA
Abstract :
Texas Instruments´ (TI), DMOS IV wafer fabrication plant´s experience with multiple complaints, underachievement to goals and limited results served as catalyst to a major redesign in its traditional performance management system. This report describes the problem solving process that identified, developed, implemented, managed and validated performance standards as a solution for unclear role definition, job expectations and an uncertain career ladder
Keywords :
integrated circuit manufacture; management; personnel; standards; DMOS IV wafer fabrication plant; high volume wafer fab; job expectations; management; performance management system; performance standards; problem solving process; unclear role definition; Engineering profession; Fabrication; Human resource management; Instruments; Management training; Manufacturing; Problem-solving; Semiconductor device manufacture; Standards development; Uncertainty;
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1999 IEEE/SEMI
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-5217-3
DOI :
10.1109/ASMC.1999.798226
