Title :
Susceptibility of integrated circuits to RFI: analysis of PWM current-mode controllers for SMPS
Author :
Citron, M. ; Corradin, M. ; Buso, S. ; Spiazzi, G. ; Fiori, F.
Author_Institution :
Dept. of Inf. Eng., Padova Univ., Italy
Abstract :
This paper deals with the analysis of the effects of radio frequency conducted interfering signals (RFI) on integrated circuits (ICs). After reviewing the basic results of the susceptibility analysis of operational amplifiers and smart power integrated circuits, the behavior of several pin-to-pin compatible control ICs for PWM current-mode switching power supplies (SMPS) has been tested in the presence of both continuous wave interfering signals (CW) as well as of pulsed noise signals (underground condition). The tested ICs were selected between some common models available on the market. The variations of the primary functional parameters (inner voltage reference, switching frequency, etc.) are evaluated in different test conditions. The paper gives a comparative view of the results, focusing on the key macroscopic effects.
Keywords :
PWM power convertors; electric current control; integrated circuits; operational amplifiers; radiofrequency interference; switched mode power supplies; PWM current-mode controllers; PWM current-mode switching power supplies; RFI; SMPS; continuous wave interfering signals; inner voltage reference; integrated circuits; integrated circuits susceptibility; macroscopic effects; operational amplifiers; pin-to-pin compatible control IC; primary functional parameters; pulsed noise signals; radio frequency conducted interfering signals; smart power IC; smart power integrated circuits; switching frequency; underground condition; Circuit analysis; Circuit testing; Pulse amplifiers; Pulse width modulation; Pulsed power supplies; RF signals; Radio frequency; Radiofrequency interference; Signal analysis; Switched-mode power supply;
Conference_Titel :
IECON 02 [Industrial Electronics Society, IEEE 2002 28th Annual Conference of the]
Print_ISBN :
0-7803-7474-6
DOI :
10.1109/IECON.2002.1182915