DocumentCode :
3232287
Title :
Investigation of the formation of undercut during the fabrication of silicon microchannels by electrochemical etching
Author :
Jilei Lin ; Xiaoming Chen ; Shaohui Xu ; Peisheng Xin ; Lianwei Wang
Author_Institution :
Dept. of Electron. Eng., East China Normal Univ., Shanghai
fYear :
2008
fDate :
6-9 Jan. 2008
Firstpage :
74
Lastpage :
77
Abstract :
Silicon microchannel plates have been explored intensively for numerous applications especially for weak light detection and night vision. The electrochemical etching in hydrofluoric acid-based solutions is known as a technique for porous silicon formation. This paper presents a new process for the formation of microchannel structure and the separation of the Si MCP from p-type starting substrates by a single-step electrochemical etching in HF-based electrolytes. High aspect ratio microchannels are fabricated by electrochemical etching and the conditions under which the undercut occurs are investigated. The formation of the undercut is found to be primarily determined by both current density and HF concentration, which determine the MCP structure thickness as well.
Keywords :
electrochemical machining; electrolytes; etching; microchannel plates; substrates; HF; HF-based electrolytes; Si; electrochemical etching; fabrication; hydrofluoric acid-based solutions; night vision; porous silicon formation; silicon microchannel plates; substrates; undercut; weak light detection; Current density; Fabrication; Hafnium; Laboratories; Microchannel; Silicon; Substrates; Systems engineering and theory; Transducers; Wet etching; HF concentration; high aspect ratio; microchannel; undercut;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
Conference_Location :
Sanya
Print_ISBN :
978-1-4244-1907-4
Electronic_ISBN :
978-1-4244-1908-1
Type :
conf
DOI :
10.1109/NEMS.2008.4484289
Filename :
4484289
Link To Document :
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