DocumentCode :
3232315
Title :
Oxidation of high area ratio silicon microchannels fabricated by electrochemical etching
Author :
Chen, Xiaoming ; Lin, Jilei ; Xu, Shaohui ; Xin, Peisheng ; Wang, Lianwei
Author_Institution :
Dept. of Electron. Eng., East China Normal Univ., Shanghai
fYear :
2008
fDate :
6-9 Jan. 2008
Firstpage :
78
Lastpage :
81
Abstract :
Silicon microchannel structures exhibit numerous possible applications. In this report, the oxidation of high area ratio silicon microchannels used in weak light detection and night vision is studied. High area ratio microchannels are fabricated by electrochemical etching, and the influences of oxidation time and environments on the microstructures are investigated and analyzed combined with computer simulation. Damages and distortion are found after the oxidation process. It is found that after oxidation at high temperature, surface morphology becomes rough and followed polishing step is recommended to smooth the silicon microchannels´ surfaces.
Keywords :
etching; microchannel plates; micromechanical devices; night vision; oxidation; polishing; electrochemical etching; high area ratio silicon microchannel oxidation; night vision; silicon microchannel structures; silicon microchannels; weak light detection; Application software; Etching; Microchannel; Microstructure; Night vision; Oxidation; Rough surfaces; Silicon; Surface morphology; Surface roughness; HF concentration; high aspect ratio; microchannel; oxidation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
Conference_Location :
Sanya
Print_ISBN :
978-1-4244-1907-4
Electronic_ISBN :
978-1-4244-1908-1
Type :
conf
DOI :
10.1109/NEMS.2008.4484290
Filename :
4484290
Link To Document :
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