• DocumentCode
    3232332
  • Title

    Vibrations and mechanically-induced currents in nanopillars transistor

  • Author

    Wan, Yue-Min ; Chen, Shiao-Yu ; Lin, Hein-Tien ; Chen, Chih-An ; Hsu, Hsiang-Chen

  • Author_Institution
    Dept. of Electron. Eng., I-Shou Univ., Kaohsiung
  • fYear
    2008
  • fDate
    6-9 Jan. 2008
  • Firstpage
    82
  • Lastpage
    85
  • Abstract
    We report measurements and numerical modeling of nanopillars transistor in consisting of a multilayer SiNx/Si/SiNx structure and an electrical side gate for single-electron tunnel and Coulomb modulation at room temperature. The device has an ultrasmall quantum box of ~ 10 times 10 times 10 nm3 and its manufacture is fully VLSI processing compatible. Finite-element analysis shows that the maximum deformation is ~ 3 Aring and the corresponding elastic energy stored is ~ 50 meV. The vibration frequency calculated is ~ 1012 Hz in consistent with interference measurement. The current induced ranging from 1 pA to 0.1 pA is also consistent with experimental data, thus confirming that single-electron tunnel indeed can generate mechanical vibrations.
  • Keywords
    VLSI; finite element analysis; silicon compounds; single electron transistors; Coulomb modulation; VLSI processing; current 1 pA to 0.1 pA; elastic energy storage; electrical side gate; finite-element analysis; mechanically-induced currents; multilayer structure; nanopillars transistor; numerical modeling; single-electron tunnel; ultrasmall quantum box; Current measurement; Electric variables measurement; Manufacturing processes; Nonhomogeneous media; Numerical models; Silicon compounds; Single electron transistors; Temperature; Very large scale integration; Vibration measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
  • Conference_Location
    Sanya
  • Print_ISBN
    978-1-4244-1907-4
  • Electronic_ISBN
    978-1-4244-1908-1
  • Type

    conf

  • DOI
    10.1109/NEMS.2008.4484291
  • Filename
    4484291