DocumentCode :
3232369
Title :
Introduction of copper electroplating into a manufacturing fabricator
Author :
Chung, Dean ; Korejwa, Josef ; Walton, Erick ; Locke, Peter
Author_Institution :
IBM Microelectron., Essex Junction, VT, USA
fYear :
1999
fDate :
1999
Firstpage :
282
Lastpage :
289
Abstract :
The introduction of copper electroplating into IBM´s manufacturing fabricators in E. Fishkill, New York, and Essex Junction, Vermont is discussed. Although electroplating has a long history of applications in industry, it has only recently been introduced into IC fabrication as an alternative means of depositing BEOL metallic conductors. Since this represents a significant departure from the traditional means of depositing metal using “dry” deposition techniques, it raises many questions regarding its integration into IC manufacturing. We report herein some of the issues confronted during the startup phase in IBM. The anticipated manufacturing issues with electroplating were three-fold: (1) tool selection, (2) fab integration, and (3) process control. The tool selection issue is significant because it plays an important role in determining the cost-of-ownership. The lack of multiple suppliers of electroplating tools suitable for incorporation into a manufacturing process was a significant concern, particularly for reasons of second sourcing. The fab integration issue primarily centered on two items: (a) risk of copper contamination as a result of the electroplating operation, and, (b) waste treatment considerations including environmental impact and cost. Finally, the question of “process control” is particularly significant since integration of plating into high-volume manufacturing requires the ability to control film deposit quality over the course of thousands of depositions with minimal operator intervention
Keywords :
copper; electroplating; integrated circuit manufacture; integrated circuit metallisation; process control; BEOL metallic conductor deposition; Cu; Cu electroplating; IC fabrication; IC manufacturing; copper contamination; cost-of-ownership; environmental impact; fab integration; film deposit quality control; high-volume manufacturing; manufacturing fabricator; process control; startup phase; tool selection; viable metallization strategy; waste treatment; Application specific integrated circuits; Conductors; Copper; Fabrication; History; Manufacturing industries; Manufacturing processes; Metals industry; Process control; Textile industry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1999 IEEE/SEMI
Conference_Location :
Boston, MA
ISSN :
1078-8743
Print_ISBN :
0-7803-5217-3
Type :
conf
DOI :
10.1109/ASMC.1999.798245
Filename :
798245
Link To Document :
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