DocumentCode :
3232447
Title :
New trends in power quality measuring instruments
Author :
Balcells, J. ; Parisi, V. ; González, D.
Author_Institution :
Departament d´´Enginyeria Electronica, Univ. Politecnica de Catalunya, Barcelona, Spain
Volume :
4
fYear :
2002
fDate :
5-8 Nov. 2002
Firstpage :
3344
Abstract :
One of the challenges in all supply systems is the control of power quality (PQ). The assessment of PQ in distributed supply systems implies the synchronized measurement of a great deal of different parameters at different points and with different requirements. The choice of suitable parameters, sampling rates "aggregation operations" and periods to obtain data containing the maximum information on possible "quality faults", using minimum memory space and minimum processor resources is one of the major problems of PQ instrumentation. An additional problem in distributed systems is the synchronization of data acquisition at different points. This paper presents the design of an instrument for PQ measurement, based on a previous analysis of CPU and memory needs. The inclusion of a high resolution real time clock with GPS synchronization allows the comparison of measurements at different points of the grid. Software for transient capture, with a trigger based on wavelet transform is also presented.
Keywords :
Global Positioning System; clocks; computerised instrumentation; data acquisition; power measurement; power supply quality; power system measurement; synchronisation; wavelet transforms; GPS synchronization; PQ instrumentation; aggregation operations; data acquisition synchronisation; distributed supply systems; high resolution real time clock; parameters; power quality control; power quality measuring instruments; quality faults; sampling rates; synchronized measurement; transient capture software; trigger; wavelet transform; Clocks; Control systems; Data acquisition; Global Positioning System; Instruments; Power measurement; Power quality; Sampling methods; Synchronization; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IECON 02 [Industrial Electronics Society, IEEE 2002 28th Annual Conference of the]
Print_ISBN :
0-7803-7474-6
Type :
conf
DOI :
10.1109/IECON.2002.1182934
Filename :
1182934
Link To Document :
بازگشت