CMOS readout system for a double-sided germanium strip detector

Author

Kroeger, R.A. ; Johnson, W.N. ; Kurfess, J.D. ; Schwarz, W.G. ; Read, M.E. ; Allen, M.D. ; Alley, G.T. ; Britton, C.L. ; Clonts, L.C. ; Ericson, M.N. ; Simpson, M.L.

Author_Institution

Naval Res. Lab., Washington, DC, USA

fYear

1997

fDate

9-15 Nov 1997

Firstpage

691

Abstract

A wide variety of applications require a hard X-ray or gamma ray detector which combine both good spatial resolution and energy resolution. Double-sided solid-state strip detectors provide this capability, We report on the development of CMOS electronics designed for photon detection with strip detectors. These electronics include a low noise preamplifier, semi-gaussian shaping amplifier, discriminator, and peak detection circuitry. All circuits are designed to operate at low power. Circuits have been duplicated in both NMOS and PMOS to provide both polarities of signals. We have constructed an 8×8 channel system to test these prototype chips. Power consumption for the preamplifier through peak-detector circuit is 4 mW/channel. The test system has a conversion gain of ~35 mV/fC, system noise (equivalent noise charge) of ENC<220 e rms (0 pF), and a dynamic range of >100:1 in both NMOS and PMOS circuits

Keywords

CMOS integrated circuits; X-ray detection; detector circuits; gamma-ray detection; germanium radiation detectors; nuclear electronics; 8×8 channel system; CMOS electronics; CMOS readout system; NMOS circuits; PMOS circuits; conversion gain; discriminator; double-sided Ge strip detector; double-sided germanium strip detector; double-sided solid-state strip detectors; dynamic range; energy resolution; equivalent noise charge; gamma ray detector; hard X-ray detector; low noise preamplifier; peak detection circuitry; peak-detector circuit; photon detection; polarities; power consumption; semi-gaussian shaping amplifier; spatial resolution; system noise; Circuit noise; Circuit testing; Energy resolution; Gamma ray detectors; Germanium; MOS devices; Preamplifiers; Spatial resolution; Strips; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium, 1997. IEEE

Conference_Location

Albuquerque, NM

ISSN

1082-3654

Print_ISBN

0-7803-4258-5

Type

conf

DOI

10.1109/NSSMIC.1997.672674

Filename

672674