DocumentCode :
3232703
Title :
MCTs and IGBT: a comparison of performance in power electronic circuits
Author :
Sul, S.K. ; Profumo, F. ; Cho, G.-H. ; Lip, T.A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
fYear :
1989
fDate :
26-29 Jun 1989
Firstpage :
163
Abstract :
There is a continuous demand for improvements in the quality of switching power devices, such as higher switching frequency, higher withstand voltage capability, larger current-handling capability, and lower conduction losses. However, for single-conduction-mechanism devices (SCRs, GTOs, BJTs, FETs), possessing all these features is probably unrealizable for physical reasons. An attractive solution appears to be double-mechanism devices, in which the features of both a minority carrier device (BJT or SCR) and a majority carrier device (MOSFET) are embedded. Both IGBTs (insulated-gate bipolar transistors) and MCTs (MOS-controlled thyristors) belong to this family of double-mechanism devices and promise to have a major impact on converter circuit signs. The authors deal with the major features of these two devices, pointing out those that are most critical to the design of power converter topologies. In particular, the two devices have been tested both in a chopper and in two resonant link converter topologies, and the experimental results are reported
Keywords :
bipolar transistors; metal-insulator-semiconductor devices; power convertors; power transistors; thyristors; IGBT; MCTs; MOS-controlled thyristors; conduction losses; current-handling; double-mechanism devices; insulated-gate bipolar transistors; performance; power converter; power transistors; switching frequency; switching power devices; withstand voltage; Circuit testing; Circuit topology; FETs; Insulated gate bipolar transistors; Insulation; MOSFET circuits; Power electronics; Switching frequency; Thyristors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Specialists Conference, 1989. PESC '89 Record., 20th Annual IEEE
Conference_Location :
Milwaukee, WI
Type :
conf
DOI :
10.1109/PESC.1989.48486
Filename :
48486
Link To Document :
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