Title :
Design and simulation of logic circuits by combined single-electron/MOS Transistor Structures
Author :
Li, Qin ; Cai, Li ; Zhou, Youjie ; Wu, Gang ; Wang, Sen
Author_Institution :
Inst. of Sci., Air Force Eng. Univ., Xian
Abstract :
Based on both the I-V characteristics of single-electron transistors and the MOS digital integrated circuit design concept, a good combination of single-electron transistors with MOS transistors is advanced to create a novel inverter, which, compared with the pure SET circuit, is considerably augmented in its voltage gain and drive capability. Then a close analysis was conducted of the inverter, on the basis of which other logic gates were presented. These logic gates are applied to the half adder circuit and the odd-even checker. The accuracy of two circuits is verified through the test on SPICE. The simulated result shows that these hybrid circuits share the merits with both SET circuits and MOS circuits. Compared with the traditional circuits, the two combinational logic circuits use fewer electronic components and are lower in power dissipation.
Keywords :
MOSFET; adders; combinational circuits; hybrid integrated circuits; logic design; logic gates; logic testing; single electron transistors; MOS transistor structures; MOS transistors; SET circuit; SPICE; combinational logic circuits; electronic components; half adder circuit; hybrid circuits; inverter; logic circuit design; logic circuit simulation; logic gates; odd-even checker; power dissipation; single-electron transistor structures; single-electron transistors; Adders; Circuit simulation; Circuit testing; Digital integrated circuits; Logic circuits; Logic gates; MOSFETs; Pulse inverters; Single electron transistors; Voltage; Half adder; Inverter; MOS; Odd-even checker; SPICE; Single Electron Transistor;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
Conference_Location :
Sanya
Print_ISBN :
978-1-4244-1907-4
Electronic_ISBN :
978-1-4244-1908-1
DOI :
10.1109/NEMS.2008.4484320