DocumentCode :
3232852
Title :
The nano-simulation of novel Magnetic Microsystems to study nanoscale material response
Author :
Lou Wen-zhong ; Ji Hong ; Yan Xiao-dong ; Wang Qian
Author_Institution :
Sch. of Aerosp. Sci. & Eng., Beijing Inst. of Technol., Beijing
fYear :
2008
fDate :
6-9 Jan. 2008
Firstpage :
219
Lastpage :
222
Abstract :
In recent years, many Microsystems have been developed, in this paper, a novel magnetic crash microsystems (MCM) are designed to integrate microsensor and microgenerator, it may satisfy the growing demand in terms of increased automotive and medical industry, the main goal of the MCM is for a novel self-power airbag systems. The problems that constrain the performance of the novel MCM , to realized the micro-magnetic system, the paper simulated the system by finite element analysis(FEA), and studied nanoscale material response, finally found out the constrained reasons and got some new methods. Also, the paper found that the conventional permanent-magnetic material used in the crash system should be replaced by Nd-Fe-B permanent-magnet. In this way, the magnetic crash microsystems can reduce the volume itself and enhance the output of electric energy.
Keywords :
automotive components; finite element analysis; micromagnetics; micromotors; microsensors; nanotechnology; neodymium alloys; permanent magnets; FEA; Nd-Fe-B; Nd-Fe-B permanent-magnet; finite element analysis; magnetic crash microsystems; micro-magnetic system; microgenerator; microsensor; nanoscale material response; permanent-magnetic material; self-power airbag systems; Analytical models; Automotive engineering; Computer crashes; Finite element methods; Magnetic materials; Medical simulation; Micromagnetics; Microsensors; Nanostructured materials; Vehicle crash testing; Microsystems; Nd-Fe-B; simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
Conference_Location :
Sanya
Print_ISBN :
978-1-4244-1907-4
Electronic_ISBN :
978-1-4244-1908-1
Type :
conf
DOI :
10.1109/NEMS.2008.4484322
Filename :
4484322
Link To Document :
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