DocumentCode :
3232917
Title :
3D Monte Carlo Device Simulation of NanoWire MOSFETs including Quantum Mechanical and Strain Effects
Author :
Ghetti, Andrea ; Rideau, Denis
Author_Institution :
Adv. R&D, STMicroelectron., Brianza
fYear :
2006
fDate :
6-8 Sept. 2006
Firstpage :
67
Lastpage :
70
Abstract :
In this paper we report on 3D Monte Carlo device simulation of silicon nanowire MOSFETs including quantum mechanical and strain effects. The newly developed simulator solves self-consistently in 1D, 2D or 3D the Schrodinger Eq. for the quantum mechanical correction of the potential, while mechanical strain effects are accounted for by an appropriate change of the band structure. The simulation program has been then applied to the simulation of silicon nanowire MOSFETs achieving a good agreement with experimental data, demonstrating the feasibility of 3D semi-classical Monte Carlo simulation with quantum mechanical correction for very advanced devices
Keywords :
MOSFET; Monte Carlo methods; Schrodinger equation; band structure; elemental semiconductors; mechanical strength; nanoelectronics; nanowires; semiconductor device models; silicon; 3D semiclassical Monte Carlo device simulation; Schrodinger equation; Si; band structure; mechanical strain effects; quantum mechanical correction; silicon nanowire MOSFET; Capacitive sensors; Circuit optimization; Computational modeling; MOSFETs; Monte Carlo methods; Nanoscale devices; Particle scattering; Quantum mechanics; Research and development; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation of Semiconductor Processes and Devices, 2006 International Conference on
Conference_Location :
Monterey, CA
Print_ISBN :
1-4244-0404-5
Type :
conf
DOI :
10.1109/SISPAD.2006.282840
Filename :
4061583
Link To Document :
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