DocumentCode
3233015
Title
Properties and devices of SiGe heterostructures and superlattices
Author
Wang, K.L. ; Karunasiri, R.P.G.
Author_Institution
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
fYear
1989
fDate
7-9 Aug 1989
Firstpage
129
Lastpage
140
Abstract
Several successful techniques for growth of pseudomorphic strained GexSi1-x layers on Si are briefly reviewed. The properties of the strained layers that affect the device design and performance are discussed. Devices based on the material are also discussed, with emphasis on heterojunction bipolar transistors (HBTs). High gain and high cutoff frequency has been predicted. Other advances, including the demonstration of tunneling structures, quantum well structures, and devices based on band-aligned superlattices, are presented. The growth of monolayer GemSin superlattices is discussed as well as the concept of Brillouin zone-folding and the formation of quasi-direct bandgaps
Keywords
Ge-Si alloys; heterojunction bipolar transistors; semiconductor materials; semiconductor quantum wells; semiconductor superlattices; silicon; tunnelling; Brillouin zone-folding; GexSi1-x-Si; HBTs; Si; band-aligned superlattices; cutoff frequency; gain; heterojunction bipolar transistors; heterostructures; monolayer superlattices; pseudomorphic strained layers; quantum well structures; quasi-direct bandgaps; semiconductor; superlattices; tunneling structures; Diodes; Epitaxial growth; Germanium silicon alloys; HEMTs; Heterojunction bipolar transistors; Lattices; Molecular beam epitaxial growth; Silicon germanium; Superlattices; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
High Speed Semiconductor Devices and Circuits, 1989. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
Conference_Location
Ithaca, NY
Type
conf
DOI
10.1109/CORNEL.1989.79828
Filename
79828
Link To Document