• DocumentCode
    3233015
  • Title

    Properties and devices of SiGe heterostructures and superlattices

  • Author

    Wang, K.L. ; Karunasiri, R.P.G.

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
  • fYear
    1989
  • fDate
    7-9 Aug 1989
  • Firstpage
    129
  • Lastpage
    140
  • Abstract
    Several successful techniques for growth of pseudomorphic strained GexSi1-x layers on Si are briefly reviewed. The properties of the strained layers that affect the device design and performance are discussed. Devices based on the material are also discussed, with emphasis on heterojunction bipolar transistors (HBTs). High gain and high cutoff frequency has been predicted. Other advances, including the demonstration of tunneling structures, quantum well structures, and devices based on band-aligned superlattices, are presented. The growth of monolayer GemSin superlattices is discussed as well as the concept of Brillouin zone-folding and the formation of quasi-direct bandgaps
  • Keywords
    Ge-Si alloys; heterojunction bipolar transistors; semiconductor materials; semiconductor quantum wells; semiconductor superlattices; silicon; tunnelling; Brillouin zone-folding; GexSi1-x-Si; HBTs; Si; band-aligned superlattices; cutoff frequency; gain; heterojunction bipolar transistors; heterostructures; monolayer superlattices; pseudomorphic strained layers; quantum well structures; quasi-direct bandgaps; semiconductor; superlattices; tunneling structures; Diodes; Epitaxial growth; Germanium silicon alloys; HEMTs; Heterojunction bipolar transistors; Lattices; Molecular beam epitaxial growth; Silicon germanium; Superlattices; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Speed Semiconductor Devices and Circuits, 1989. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
  • Conference_Location
    Ithaca, NY
  • Type

    conf

  • DOI
    10.1109/CORNEL.1989.79828
  • Filename
    79828