• DocumentCode
    3233200
  • Title

    High quality uniform random number generation for massively parallel simulations in FPGA

  • Author

    Thomas, David B. ; Luk, Wayne

  • Author_Institution
    Dept. of Comput., Imperial Coll., London
  • fYear
    2005
  • fDate
    28-30 Sept. 2005
  • Lastpage
    12
  • Abstract
    This paper details the design and implementation of three uniform random number generators for use in massively parallel simulations in FPGAs. The three different generators are tailored to make use of three different types of hardware resource: logic, RAM, and DSP blocks. This allows the random number generator to be fitted into resources left-over after the main application has been written. The three generators all pass the most stringent empirical statistical tests for randomness, and all have periods appropriate for long running simulations
  • Keywords
    digital signal processing chips; field programmable gate arrays; logic design; random number generation; random-access storage; DSP; FPGA; RAM; logic block; parallel simulation; random number generation; statistical test; Computational modeling; Concurrent computing; Digital signal processing; Field programmable gate arrays; Hardware; Logic testing; Parallel processing; Random number generation; Random sequences; Read-write memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reconfigurable Computing and FPGAs, 2005. ReConFig 2005. International Conference on
  • Conference_Location
    Puebla City
  • Print_ISBN
    0-7695-2456-7
  • Type

    conf

  • DOI
    10.1109/RECONFIG.2005.24
  • Filename
    1592494