Title :
An improved method for TRL calibration
Author :
Liu, Yu ; Tian, Yu ; Gao, Bo ; Tong, Ling
Author_Institution :
Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
Based on the ten-term error model of a two-port vector network analyzer (VNA) measurement system, the TRL (Thru-Reflect-Line) calibration is implemented. Then ten error terms of fixtures are derived directly from the S parameters of the calibration kits measured from the coaxial reference plane without converting S parameters to T parameters. To test our algorithm, two test boards with different via diameters are designed and measured. By comparing with Engen´s TRL algorithm it is certified that those equations are available over a wide frequency range.
Keywords :
S-parameters; calibration; network analysers; Engen TRL algorithm; S parameters; TRL calibration; VNA measurement system; coaxial reference plane; thru-reflect-line; two-port vector network analyzer; Algorithm design and analysis; Calibration; Chromium; Coaxial components; Equations; Fixtures; Frequency; Microstrip; Scattering parameters; Testing;
Conference_Titel :
Microwave and Millimeter Wave Technology (ICMMT), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5705-2
DOI :
10.1109/ICMMT.2010.5525031
