DocumentCode :
3233498
Title :
Proton irradiation for improved GTO thyristors
Author :
Bakowski, Mietek ; Galster, Norbert ; Hallén, Anders ; Weber, André
Author_Institution :
IMC, Kista, Sweden
fYear :
1997
fDate :
26-29 May 1997
Firstpage :
77
Lastpage :
80
Abstract :
We apply proton irradiation to tailor the lifetime in large area 2.5 kV and 4.5 kV standard GTO thyristors. The devices are already optimised with respect to the trade-offs between physical properties. Nevertheless, it is shown that proton irradiation allows for individual optimisation of IGT and Eoff, increasing the degree of freedom for the GTO design. These two parameters can thus be trimmed independently after processing and before encapsulation
Keywords :
carrier lifetime; proton effects; thyristors; 125 C; 2.5 kV; 25 C; 4.5 kV; GTO design; GTO thyristors; device optimisation; gate trigger current; lifetime control; proton irradiation; turn-off losses; Anodes; Cathodes; Charge carriers; Doping; Electrons; Performance loss; Production; Protons; Thyristors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and IC's, 1997. ISPSD '97., 1997 IEEE International Symposium on
Conference_Location :
Weimar
ISSN :
1063-6854
Print_ISBN :
0-7803-3993-2
Type :
conf
DOI :
10.1109/ISPSD.1997.601436
Filename :
601436
Link To Document :
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