Workload regulating wafer release in a GaAs fab facility

Author

Lawton, James W. ; Drake, Al ; Henderson, Rebecca ; Wein, Lawrence M. ; Whitney, Ron ; Zuanich, Dick

Author_Institution

MIT, Cambridge, MA, USA

fYear

1990

fDate

21-23 May 1990

Firstpage

33

Lastpage

38

Abstract

The workload regulating wafer release policy, that was developed for MWTD´s (Hewlett-Packard´s Microwave Technology Division) GaAs fabrication facility is described. A discrete-event simulator, ManSim was used to determine its improvements over other wafer release policies, and it was shown that it has the potential to reduce fabrication cycle time by roughly 50%. It is suggested that the plant´s historical focus on leading-edge process technology rather than on more traditional measures of manufacturing performance has delayed the recognition of the potential of a policy of this type

Keywords

MMIC; gallium arsenide; integrated circuit manufacture; management; GaAs fab facility; Hewlett-Packard; ManSim; Microwave Technology Division; discrete-event simulator; fabrication cycle time reduction; leading-edge process technology; workload regulating wafer release policy; Circuits; Delay; Engineering management; Gallium arsenide; Inhibitors; Instruments; MMICs; Microwave technology; Technology management; Workstations;

fLanguage

English

Publisher

ieee

Conference_Titel

Semiconductor Manufacturing Science Symposium, 1990. ISMSS 1990., IEEE/SEMI International

Conference_Location

Burlingame, CA

Type

conf

DOI

10.1109/ISMSS.1990.66125

Filename

66125