DocumentCode :
3233542
Title :
Workload regulating wafer release in a GaAs fab facility
Author :
Lawton, James W. ; Drake, Al ; Henderson, Rebecca ; Wein, Lawrence M. ; Whitney, Ron ; Zuanich, Dick
Author_Institution :
MIT, Cambridge, MA, USA
fYear :
1990
fDate :
21-23 May 1990
Firstpage :
33
Lastpage :
38
Abstract :
The workload regulating wafer release policy, that was developed for MWTD´s (Hewlett-Packard´s Microwave Technology Division) GaAs fabrication facility is described. A discrete-event simulator, ManSim was used to determine its improvements over other wafer release policies, and it was shown that it has the potential to reduce fabrication cycle time by roughly 50%. It is suggested that the plant´s historical focus on leading-edge process technology rather than on more traditional measures of manufacturing performance has delayed the recognition of the potential of a policy of this type
Keywords :
MMIC; gallium arsenide; integrated circuit manufacture; management; GaAs fab facility; Hewlett-Packard; ManSim; Microwave Technology Division; discrete-event simulator; fabrication cycle time reduction; leading-edge process technology; workload regulating wafer release policy; Circuits; Delay; Engineering management; Gallium arsenide; Inhibitors; Instruments; MMICs; Microwave technology; Technology management; Workstations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Manufacturing Science Symposium, 1990. ISMSS 1990., IEEE/SEMI International
Conference_Location :
Burlingame, CA
Type :
conf
DOI :
10.1109/ISMSS.1990.66125
Filename :
66125
Link To Document :
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