Title :
Early robustness evaluation of digital integrated systems
Author_Institution :
TIMA Lab., UJF, Grenoble, France
Abstract :
Evaluating the sensitivity of digital integrated systems with respect to soft errors has become an important part of the design flow for many applications. This presentation quickly discusses the most typical approaches used today to analyze the robustness from the application viewpoint.
Keywords :
digital integrated circuits; embedded systems; integrated circuit design; design flow; digital integrated system; robustness evaluation; soft error;
Conference_Titel :
Specification & Design Languages (FDL 2010), 2010 Forum on
Conference_Location :
Southampton
DOI :
10.1049/ic.2010.0131
