DocumentCode
3233664
Title
Early robustness evaluation of digital integrated systems
Author
Leveugle, R.
Author_Institution
TIMA Lab., UJF, Grenoble, France
fYear
2010
fDate
14-16 Sept. 2010
Firstpage
1
Lastpage
2
Abstract
Evaluating the sensitivity of digital integrated systems with respect to soft errors has become an important part of the design flow for many applications. This presentation quickly discusses the most typical approaches used today to analyze the robustness from the application viewpoint.
Keywords
digital integrated circuits; embedded systems; integrated circuit design; design flow; digital integrated system; robustness evaluation; soft error;
fLanguage
English
Publisher
iet
Conference_Titel
Specification & Design Languages (FDL 2010), 2010 Forum on
Conference_Location
Southampton
Type
conf
DOI
10.1049/ic.2010.0131
Filename
5775111
Link To Document