• DocumentCode
    3233676
  • Title

    Surface reactions of SF6 decomposition products

  • Author

    Piemontesi, M. ; Niemeyer, L.

  • Author_Institution
    High Voltage Lab., Swiss Federal Inst. of Technol., Zurich, Switzerland
  • Volume
    2
  • fYear
    1996
  • fDate
    20-23 Oct 1996
  • Firstpage
    585
  • Abstract
    This paper reports investigations on decay reactions of several SF 6 decomposition products on technical surfaces at room temperature. Processes were measured, with and without addition of water, with SF6 or argon as background gases. The surfaces were stainless steel, aluminium (GIS enclosure), and glass. The stainless steel surface was pretreated in different ways to investigate the role of the surface state. The SF6 decomposition products studied were S2F10, S2O2F 10, SOF2, SOF4, and SF4. Their decay was measured by detecting the temporal development of their gas phase concentrations and of the concentrations of some of their gaseous reaction products by means of a FT-IR spectrometer. From the data obtained it can be inferred that surface decay is dominant at room temperature. Simple stoichiometric and kinetic models for these processes are proposed which provide a basis for the quantification on the life times and decay rates of toxic and corrosive decomposition products in SF6 insulated power equipment. They also provide some information on the limitations of gas sample storage
  • Keywords
    SF6 insulation; corrosion; decomposition; gas insulated switchgear; surface discharges; GIS enclosure; S2F10; S2O2F10; SF4; SF6; SOF2; SOF4; corrosive products; decay reactions; decomposition products; gas phase concentrations; kinetic models; stoichiometric models; surface decay; surface state; technical surfaces; temporal development; Aluminum; Argon; Gases; Geographic Information Systems; Glass; Phase detection; Phase measurement; Spectroscopy; Steel; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1996., IEEE 1996 Annual Report of the Conference on
  • Conference_Location
    Millbrae, CA
  • Print_ISBN
    0-7803-3580-5
  • Type

    conf

  • DOI
    10.1109/CEIDP.1996.564539
  • Filename
    564539