DocumentCode :
3233766
Title :
An interaction testing technique between hardware and software in embedded systems
Author :
Sung, Ahyoung ; Choi, Byoungju
Author_Institution :
Dept. of Comput. Sci. & Eng., Ehwa Women´´s Univ., Seoul, South Korea
fYear :
2002
fDate :
2002
Firstpage :
457
Lastpage :
464
Abstract :
An embedded system is an electronically controlled system combining hardware and software. Many systems used in real life such as power plants, medical instrument systems and home appliances are embedded. However, studies related to embedded system testing are insufficient. In embedded systems, it is necessary to develop a test technique to detect faults in interaction between hardware and software. We propose a test data selection technique using fault injection for the interaction between hardware and software. The proposed test data selection technique first simulates behavior of a software program from requirements specification. Hardware faults, after being converted to software faults, are then injected into the simulated program. We finally select effective test data to detect faults caused by the interactions between hardware and software. We apply our technique to a digital plant protection system and evaluate the effectiveness of selected test data through experiments.
Keywords :
embedded systems; formal specification; program testing; digital plant protection system; embedded systems; fault detection; fault injection technique; hardware/software interaction testing technique; home appliances; medical instrument system; power plant; requirements specification; simulation; software program; test data selection technique; Control systems; Embedded software; Embedded system; Fault detection; Hardware; Medical control systems; Power generation; Software systems; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Engineering Conference, 2002. Ninth Asia-Pacific
ISSN :
1530-1362
Print_ISBN :
0-7695-1850-8
Type :
conf
DOI :
10.1109/APSEC.2002.1183017
Filename :
1183017
Link To Document :
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