DocumentCode :
3233839
Title :
Simulation of the diaphragm properties of a PZT-based valveless micropump
Author :
Hou, Wensheng ; Das, B. ; Jiang, Yingtao ; Qian, Shizhi ; Zheng, Xiaolin ; Pi, Xitian ; Yang, Jun ; Liu, Hongying ; Zheng, Jun ; Zheng, Zhigao
Author_Institution :
Dept. of Biomed. Eng., Chongqing Univ., Chongqing
fYear :
2008
fDate :
6-9 Jan. 2008
Firstpage :
449
Lastpage :
452
Abstract :
PZT-based micropump is a broadly studied microactuator that could be potentially used for controlling and delivering tiny amounts of fluids as it has simple structure and no internal moving parts. This paper presents a PZT-based micropump which pump fluid via the motion of diaphragm bonded to the piezoelectric element. The mechanical properties of diaphragm driven by input voltages have been analyzed here with ANSYS. The simulation results indicate that the profile of either displacement or velocity of diaphragm is a parabolic surface, in which the maximal value occurred in the central area of diaphragm, and the minimal value occurred at the boundary. Furthermore, the activities of vibration membrane of micropump would be controlled by the driving voltage and thickness of PZT patch, and the displacement of vibration membrane would increase with either the increment of driving voltage or decrement of PZT thickness. The proposed micropump can be potentially integrated into a transdermal drug delivery system, and the simulation results demonstrate its utility as an efficient tool for PZT-based micropump design.
Keywords :
diaphragms; microactuators; micropumps; piezoelectric materials; PZT; diaphragm properties; mechanical properties; microactuator; parabolic surface; piezoelectric element; valveless micropump; vibration membrane; Biomembranes; Bonding; Displacement control; Mechanical factors; Microactuators; Micropumps; Pumps; Thickness control; Vibration control; Voltage control; PZT; diaphragm; mechanical; micropump;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
Conference_Location :
Sanya
Print_ISBN :
978-1-4244-1907-4
Electronic_ISBN :
978-1-4244-1908-1
Type :
conf
DOI :
10.1109/NEMS.2008.4484369
Filename :
4484369
Link To Document :
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