Abstract :
The following topics are dealt with: ATE/TPS Development/Design; New Test/Diagnostic Techniques; Innovative Approaches to Sensor Technology; ATML; Testability and Diagnosability; Prognostic Health Management; ATE Management - Information Frameworks; Synthetic Instruments; Artificial Intelligence in Test; ATE/TPS Development Techniques; Test Requirements (How Much is Needed?); New Techniques for Circuit Readiness Verification; Interoperable Test Systems; IEEE 1641 Standard; No-Fault-Found Strategies; Measurement Science; Next Generation Test Systems; Diagnostic Advances and New Techniques; Parallel Testing Techniques; Alternative Test Techniques; Data Acquisition; Parallel Testing/Common Software Interface; ATE/TPS Obsolescence; Dealing with Diagnostic Complications Resulting from Cannot Duplicates; Vehicle Health Management & Test Strategies; BIT/BIST and Innovative Testing Techniques; VDATS.
Keywords :
automatic test equipment; automatic testing; condition monitoring; design for testability; virtual instrumentation; ATE; ATML; DFT; IEEE 1641 standard; USAF Versatile Automated Depot Test System; VDATS; artificial intelligence; automated test equipment; circuit readiness verification; data acquisition; design-for-test; diagnosability; diagnostic techniques; electronics test; health management; health monitoring; parallel testing; prognostics; sensor technology; synthetic instrumentation; synthetic instruments; test system common software interface; test techniques; testability;
Conference_Titel :
AUTOTESTCON, 2008 IEEE
Conference_Location :
Salt Lake City, UT
Print_ISBN :
978-1-4244-2225-8
DOI :
10.1109/AUTEST.2008.4662555
