DocumentCode :
3234026
Title :
Technical Program Committee
fYear :
2008
fDate :
8-11 Sept. 2008
Abstract :
Provides a listing of current committee members.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2008 IEEE
Conference_Location :
Salt Lake City, UT
ISSN :
1088-7725
Print_ISBN :
978-1-4244-2225-8
Type :
conf
DOI :
10.1109/AUTEST.2008.4662559
Filename :
4662559
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3234026
