Title :
Fabrication of carbon nanotube sensor device by inkjet printing
Author :
Yun, Ju-Hyung ; Chang-Soo, Han ; Kim, Joondong ; Song, Jin-Won ; Shin, Dong-Hun ; Park, Young-Geun
Author_Institution :
Korea Inst. of Machinery & Mater., Seoul
Abstract :
To overcome the limitation of conventional carbon nanotube fabrication techniques, inkjet printing was directly utilized on a whole wafer. In this work, inkjet printing method was used as a strong technique for the massive production of gas sensor applications. As a single wafer processing, it provided the great potential to fabricate uniform and reproducible single walled carbon nanotube (SWCNT) films on desired positions in terms of electrical characteristics and gas reaction performances. In order to secure good electrical contact between SWCNTs and the metal electrode, SWCNTs were firstly printed on a wafer with insulation layer, and then the metal electrodes were patterned by using lift-off process. The fabricated gaps of the electrodes were 2, 4, and 8 m, respectively. SWCNT films contacted tightly beneath the electrode show low and uniform electrical resistance values of 96-281 and reliable gas detection performances as well. In this work, As-deposited devices exhibit about 3% sensitivities to 100ppb - NO2 in 10 minutes and increased up to 9% by the annealing treatments at 400degC.
Keywords :
annealing; arsenic; carbon nanotubes; electrical contacts; gas sensors; nitrogen compounds; printing; As; NO2; SWCNT films; annealing treatments; carbon nanotube sensor device; electrical contact; electrical resistance; gas detection; gas sensor; inkjet printing method; insulation layer; lift-off process; massive production; metal electrode; single wafer processing; single walled carbon nanotube films; temperature 400 C; time 10 min; Carbon nanotubes; Contacts; Dielectrics and electrical insulation; Electric resistance; Electric variables; Electrodes; Fabrication; Gas detectors; Printing; Production; carbon nanotube; gas sensor; inkjet printing;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
Conference_Location :
Sanya
Print_ISBN :
978-1-4244-1907-4
Electronic_ISBN :
978-1-4244-1908-1
DOI :
10.1109/NEMS.2008.4484382