A dynamic force microscope based nanomanipulation system

Author

Liu, Zhihua ; Yang, Yongliang ; Dong, Zaili ; Wang, Yuechao

Author_Institution

Shenyang Inst. of Autom., Chinese Acad. of Sci., Shenyang

fYear

2008

fDate

6-9 Jan. 2008

Firstpage

536

Lastpage

539

Abstract

There has been great interest in exploring the effective manipulation methods to build miniaturized system, devices, structures and machines in nanoscale. In this paper, a novel nanomanipulation system based on dynamic force microscope has been developed, that can be used to position and orient multiwall carbon nanotubes on the dynamic force probe model. The physical principles of the dynamic force probe model are described. And the nanomanipulation system based on the nanoscale operation approach is introduced. Some typical nanomanipulation experiments show that multiwall carbon nanotubes can be reliably positioned and oriented, that illustrated the effectiveness of such method and the nanomanipulation system.

Keywords

microscopes; nanoelectronics; scanning probe microscopy; dynamic force microscope; dynamic force probe model; miniaturized devices; miniaturized machines; miniaturized structures; miniaturized system; multiwall carbon nanotubes; nanomanipulation system; nanoscale operation; Atomic force microscopy; Automation; Carbon nanotubes; Control systems; Design for manufacture; Equations; Manipulator dynamics; Nanoscale devices; Photodiodes; Probes; AFM; DFM; nanomanipulation;

fLanguage

English

Publisher

ieee

Conference_Titel

Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on

Conference_Location

Sanya

Print_ISBN

978-1-4244-1907-4

Electronic_ISBN

978-1-4244-1908-1

Type

conf

DOI

10.1109/NEMS.2008.4484389

Filename

4484389