DocumentCode :
3234423
Title :
Multiresolution sensor fusion approach to PCB fault detection and isolation
Author :
Wright, R. Glenn
Author_Institution :
GMA Ind., Inc., Annapolis, MD
fYear :
2008
fDate :
8-11 Sept. 2008
Firstpage :
41
Lastpage :
46
Abstract :
This paper describes a novel approach to printed circuit board (PCB) testing that fuses the products of individual, non-traditional sensors to draw conclusions regarding overall PCB health and performance. This approach supplements existing parametric test capabilities with the inclusion of sensors for electromagnetic emissions, laser Doppler vibrometry, off-gassing and material parameters, and X-ray and Terahertz spectral images of the PCB. This approach lends itself to the detection and prediction of entire classes of anomalies, degraded performance, and failures that are not detectable using current automatic test equipment (ATE) or other test devices performing end-to-end diagnostic testing of individual signal parameters. This greater performance comes with a smaller price tag in terms of non-recurring development and recurring maintenance costs over currently existing test program sets. The complexities of interfacing diverse and unique sensor technologies with the PCB are discussed from both the hardware and software perspective. Issues pertaining to creating a whole-PCB interface, not just at the card-edge connectors, are addressed. In addition, we discuss methods of integrating and interpreting the unique software inputs obtained from the various sensors to determine the existence of anomalies that may be indicative of existing or pending failures within the PCB. Indications of how these new sensor technologies may comprise future test systems, as well as their retrofit into existing test systems, will also be provided.
Keywords :
automatic test equipment; fault simulation; printed circuit testing; sensor fusion; PCB fault detection; PCB health; automatic test equipment; card-edge connectors; end-to-end diagnostic testing; fault isolation; individual nontraditional sensors; multiresolution sensor fusion approach; parametric test capabilities; printed circuit board testing; test program sets; whole-PCB interface; Automatic testing; Circuit testing; Electrical fault detection; Fault detection; Fuses; Printed circuits; Sensor fusion; Signal resolution; System testing; X-ray lasers; ATE; EME; ICs; TPS; X-ray; automatic test equipment; electromagnetic emissions; integrated circuits; nanotechnology; printed circuit board; sensor fusion; test program set;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2008 IEEE
Conference_Location :
Salt Lake Cirty, UT
ISSN :
1088-7725
Print_ISBN :
978-1-4244-2225-8
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2008.4662581
Filename :
4662581
Link To Document :
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