Title :
Designing Testable Plas for both Offline Testing and Concurrent Error Detection
Author :
Sharma, Rajiv ; Rajashekhara, T.N.
Author_Institution :
Dept. of Electrical Engineering, The Watson School, SUNY, Binghamton, NY
Keywords :
Programmable logic arrays; Testing;
Conference_Titel :
Southern Tier Technical Conference, 1987. Proceedings of the 1987 IEEE
DOI :
10.1109/STIER.1987.716350
