DocumentCode
3234559
Title
Analyzing and improving clustering based sampling for microprocessor simulation
Author
Luo, Yue ; Joshi, Ajay ; Phansalkar, Aashish ; John, Lizy ; Ghosh, Joydeep
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
fYear
2005
fDate
24-27 Oct. 2005
Firstpage
193
Lastpage
200
Abstract
We propose a set of statistical metrics for making a comprehensive, fair, and insightful evaluation of features, clustering algorithms, and distance measures in representative sampling techniques for microprocessor simulation. Our evaluation of clustering algorithms using these metrics shows that CLARANS clustering algorithm produces better quality clusters in the feature space and more homogeneous phases for CPI compared to the popular k-means algorithm. We also propose a new micro-architecture independent data locality based feature, reuse distance distribution (RDD), for finding phases in programs, and show that the RDD feature consistently results in more homogeneous phases than basic block vector (BBV) for many SPEC CPU2000 benchmark programs.
Keywords
computer architecture; microprocessor chips; pattern clustering; statistical analysis; CLARANS clustering algorithm; basic block vector; clustering based sampling; microarchitecture independent data locality based feature; microprocessor simulation; representative sampling technique; reuse distance distribution; statistical metrics; Analytical models; Clustering algorithms; Computational modeling; Computer architecture; Computer simulation; Data mining; Microarchitecture; Microprocessors; Phase measurement; Sampling methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Architecture and High Performance Computing, 2005. SBAC-PAD 2005. 17th International Symposium on
ISSN
1550-6533
Print_ISBN
0-7695-2446-X
Type
conf
DOI
10.1109/CAHPC.2005.11
Filename
1592573
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