• DocumentCode
    3234559
  • Title

    Analyzing and improving clustering based sampling for microprocessor simulation

  • Author

    Luo, Yue ; Joshi, Ajay ; Phansalkar, Aashish ; John, Lizy ; Ghosh, Joydeep

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
  • fYear
    2005
  • fDate
    24-27 Oct. 2005
  • Firstpage
    193
  • Lastpage
    200
  • Abstract
    We propose a set of statistical metrics for making a comprehensive, fair, and insightful evaluation of features, clustering algorithms, and distance measures in representative sampling techniques for microprocessor simulation. Our evaluation of clustering algorithms using these metrics shows that CLARANS clustering algorithm produces better quality clusters in the feature space and more homogeneous phases for CPI compared to the popular k-means algorithm. We also propose a new micro-architecture independent data locality based feature, reuse distance distribution (RDD), for finding phases in programs, and show that the RDD feature consistently results in more homogeneous phases than basic block vector (BBV) for many SPEC CPU2000 benchmark programs.
  • Keywords
    computer architecture; microprocessor chips; pattern clustering; statistical analysis; CLARANS clustering algorithm; basic block vector; clustering based sampling; microarchitecture independent data locality based feature; microprocessor simulation; representative sampling technique; reuse distance distribution; statistical metrics; Analytical models; Clustering algorithms; Computational modeling; Computer architecture; Computer simulation; Data mining; Microarchitecture; Microprocessors; Phase measurement; Sampling methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Architecture and High Performance Computing, 2005. SBAC-PAD 2005. 17th International Symposium on
  • ISSN
    1550-6533
  • Print_ISBN
    0-7695-2446-X
  • Type

    conf

  • DOI
    10.1109/CAHPC.2005.11
  • Filename
    1592573