DocumentCode :
3234559
Title :
Analyzing and improving clustering based sampling for microprocessor simulation
Author :
Luo, Yue ; Joshi, Ajay ; Phansalkar, Aashish ; John, Lizy ; Ghosh, Joydeep
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
fYear :
2005
fDate :
24-27 Oct. 2005
Firstpage :
193
Lastpage :
200
Abstract :
We propose a set of statistical metrics for making a comprehensive, fair, and insightful evaluation of features, clustering algorithms, and distance measures in representative sampling techniques for microprocessor simulation. Our evaluation of clustering algorithms using these metrics shows that CLARANS clustering algorithm produces better quality clusters in the feature space and more homogeneous phases for CPI compared to the popular k-means algorithm. We also propose a new micro-architecture independent data locality based feature, reuse distance distribution (RDD), for finding phases in programs, and show that the RDD feature consistently results in more homogeneous phases than basic block vector (BBV) for many SPEC CPU2000 benchmark programs.
Keywords :
computer architecture; microprocessor chips; pattern clustering; statistical analysis; CLARANS clustering algorithm; basic block vector; clustering based sampling; microarchitecture independent data locality based feature; microprocessor simulation; representative sampling technique; reuse distance distribution; statistical metrics; Analytical models; Clustering algorithms; Computational modeling; Computer architecture; Computer simulation; Data mining; Microarchitecture; Microprocessors; Phase measurement; Sampling methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Architecture and High Performance Computing, 2005. SBAC-PAD 2005. 17th International Symposium on
ISSN :
1550-6533
Print_ISBN :
0-7695-2446-X
Type :
conf
DOI :
10.1109/CAHPC.2005.11
Filename :
1592573
Link To Document :
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