ATML and ‘dot’ standards status

Author

Gorringe, Chris ; Seavey, Michael ; Lopes, Teresa

Author_Institution

EADS Test Eng. Services (UK) Ltd., Wimborne

fYear

2008

fDate

8-11 Sept. 2008

Firstpage

69

Lastpage

73

Abstract

This document provides an overview of the extensible markup language (XML) test information interchange standards known collectively as automatic test markup language or ATML. The document describes how the various components fit under the over arching IEEE 1671-2006 framework document and how ATML draws on other test standards to provide a comprehensive set of related standards within a common framework.

Keywords

IEEE standards; XML; automatic test software; ATML; IEEE 1671-2006 framework document; XML test information interchange standards; automatic test markup language; dot standards status; extensible markup language; Automatic test equipment; Automatic testing; Cities and towns; Instruments; Markup languages; Standards publication; System testing; USA Councils; Web sites; XML; ATML; IEEE 1636; IEEE 1641; IEEE 1671; Instrument Description; Signal Modeling; Test Adaptor Description; Test Configuration; Test Description; Test Results; Test Station Description; UUT Description;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON, 2008 IEEE

Conference_Location

Salt Lake Cirty, UT

ISSN

1088-7725

Print_ISBN

978-1-4244-2225-8

Electronic_ISBN

1088-7725

Type

conf

DOI

10.1109/AUTEST.2008.4662587

Filename

4662587