Title :
ATML and ‘dot’ standards status
Author :
Gorringe, Chris ; Seavey, Michael ; Lopes, Teresa
Author_Institution :
EADS Test Eng. Services (UK) Ltd., Wimborne
Abstract :
This document provides an overview of the extensible markup language (XML) test information interchange standards known collectively as automatic test markup language or ATML. The document describes how the various components fit under the over arching IEEE 1671-2006 framework document and how ATML draws on other test standards to provide a comprehensive set of related standards within a common framework.
Keywords :
IEEE standards; XML; automatic test software; ATML; IEEE 1671-2006 framework document; XML test information interchange standards; automatic test markup language; dot standards status; extensible markup language; Automatic test equipment; Automatic testing; Cities and towns; Instruments; Markup languages; Standards publication; System testing; USA Councils; Web sites; XML; ATML; IEEE 1636; IEEE 1641; IEEE 1671; Instrument Description; Signal Modeling; Test Adaptor Description; Test Configuration; Test Description; Test Results; Test Station Description; UUT Description;
Conference_Titel :
AUTOTESTCON, 2008 IEEE
Conference_Location :
Salt Lake Cirty, UT
Print_ISBN :
978-1-4244-2225-8
Electronic_ISBN :
1088-7725
DOI :
10.1109/AUTEST.2008.4662587
