Title :
Justifying DFT with a hierarchical top-down cost-benefit model
Author_Institution :
Sun Microsyst., Inc., Sunnyvale, CA
Abstract :
How can we justify system level DFT? We must show that it has a positive return on investment. Existing test ROI models are manufacturing centric, do not account for the disaggregation of the product realization process, and are often focused on a specific DFT method. We propose a new, top-down, hierarchical ROI model, which starts with potential benefits and can handle entire systems more effectively than current models.
Keywords :
cost-benefit analysis; design for testability; design for testability; hierarchical top-down cost-benefit model; product realization process; return on investment; system level DFT; test ROI models; Cities and towns; Costs; Design for testability; Integrated circuit modeling; Integrated circuit testing; Investments; Production facilities; System testing; Uncertainty; Virtual manufacturing; DFT; Return on Investment; Test Economics;
Conference_Titel :
AUTOTESTCON, 2008 IEEE
Conference_Location :
Salt Lake Cirty, UT
Print_ISBN :
978-1-4244-2225-8
Electronic_ISBN :
1088-7725
DOI :
10.1109/AUTEST.2008.4662588
