Title :
InGaN/GaN multiple quantum wells with silicon delta doping in GaN barriers for light-emitting diodes
Author :
Wu, G.M. ; Chung, T.J. ; Nee, T.E. ; Wang, J.C. ; Lu, H.C.
Author_Institution :
Inst. of Electro-Opt. Eng., Chang Gung Univ., Taoyuan
Abstract :
In this paper, silicon delta doping was incorporated in the GaN barriers of InGaN/GaN multiple quantum well (MQW) structures for blue light-emitting diodes. High-order satellite peaks from X-ray diffraction suggested indium incorporation in the hetero-structures. The indium content has been 0.171 and 0.192 for the silicon delta doped and undoped samples, respectively, by Vegard´s rule. Thermodynamic analysis by Arrhenius plots of the temperature-dependent photoluminescence spectra revealed the enhancements in radiative recombination. The activation energy was shown to be 130 meV for the InGaN/GaN MQW structures with silicon delta doping. It was 110 meV for the undoped samples. The increase in the thermal activation energy was attributed to the supply of electrons from the silicon delta doping barrier region into the InGaN quantum wells. The hole-capturing by higher energy barrier in the valence band was also increased. Silicon delta doping suppresses carrier leakage by increasing exciton confinement, and therefore improves the quantum efficiency.
Keywords :
doping; light emitting diodes; quantum wells; In; InGaN-GaN; X-ray diffraction; blue light-emitting diodes; exciton confinement; hole-capturing; multiple quantum well structures; radiative recombination; silicon delta doping; temperature-dependent photoluminescence spectra; thermal activation energy; thermodynamic analysis; valence band; Doping; Gallium nitride; Indium; Light emitting diodes; Photoluminescence; Quantum well devices; Satellites; Silicon; Thermodynamics; X-ray diffraction; gallium nitride; multiple quantum well; photoluminescence; silicon doping;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2008. NEMS 2008. 3rd IEEE International Conference on
Conference_Location :
Sanya
Print_ISBN :
978-1-4244-1907-4
Electronic_ISBN :
978-1-4244-1908-1
DOI :
10.1109/NEMS.2008.4484403