3234683

A Generalized Approach for Automatic Test Pattern Generation

Raina, Rajeah ; Rajashekhara, T.N.

Dept. of Electrical Engineering, The Watson School, SUNY, Binghamton, NY

1987

31896

15

15

Automatic test pattern generation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Dictionaries; Libraries; Test pattern generators;

English

ieee

Southern Tier Technical Conference, 1987. Proceedings of the 1987 IEEE

conf

10.1109/STIER.1987.716357

716357