DocumentCode :
3234684
Title :
Power supply health management — deploying prognostics technology for enhanced weapon system depot support
Author :
Boodhansingh, Anthony J. ; Kalgren, Patrick W. ; Ginart, Antonio
Author_Institution :
Impact Technol. LLC, Rochester, NY
fYear :
2008
fDate :
8-11 Sept. 2008
Firstpage :
104
Lastpage :
109
Abstract :
Recent technical advances in assessing power supply degradation have spawned new capabilities for deploying electronics health management systems (HMS). The work described herein has extended and matured previous efforts by the authors. A methodology for implementing health monitoring for switched-mode power supplies was outlined in . The authors present the integration of power supply characterization techniques into an automated test package as a depot-level use case and outline the development of O-level and embedded implementations in support of the verticality of test philosophy. We also discuss the future work efforts being pursued to implement the power supply HMS technology within the maintenance infrastructure, and to further enhance the technology through remaining useful life (RUL) studies and new techniques for accelerated test. Finally, a real-world cost benefit is presented for a critical avionic system to justify technology adoption due to its positive impact on availability, maintenance support and return on investment.
Keywords :
automatic test equipment; power electronics; switched mode power supplies; automatic test equipment; electronics health management systems; enhanced weapon system depot support; health monitoring; power supply health management; prognostics technology; remaining useful life; switched-mode power supplies; Automatic testing; Degradation; Electronics packaging; Energy management; Monitoring; Power supplies; Power system management; Switched-mode power supply; Technology management; Weapons; ATE; diagnostics and prognostics; health management systems; switched-mode power supply; test verticality;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2008 IEEE
Conference_Location :
Salt Lake Cirty, UT
ISSN :
1088-7725
Print_ISBN :
978-1-4244-2225-8
Electronic_ISBN :
1088-7725
Type :
conf
DOI :
10.1109/AUTEST.2008.4662593
Filename :
4662593
Link To Document :
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