DocumentCode :
3234686
Title :
Research on Si-based MEMS process in development 3D millimeter-wave multi-chip module package
Author :
Wu, Liang ; Wang, Huajiang ; Tang, Jiajie ; Qian, Rong ; Hou, Yang ; Wang, Wei ; Hao, Sun ; Li, Lingyun ; Sun, Xiaowei ; Luo, Le
Author_Institution :
Shanghai Inst. of Micro-Syst. & Inf. Technol., Chinese Acad. of Sci. Shanghai, Shanghai, China
fYear :
2010
fDate :
8-11 May 2010
Firstpage :
1049
Lastpage :
1052
Abstract :
A low cost & feasible system on package solution on the basis of BCB and silicon wafer (10 Ohm·mm)-Si-Based 3D MMCM package solution is presented in this paper. What is more, a standard Si-Based MEMS process is employed to achieve package and revision of a GaAs-Based Monolithic Amplifier circuit. The measured results show that input return loss is less than 20 dB; moreover, small signal gain is more than 17 dB across 21 GHz to 26 GHz. The excellent measured results make the Si-based 3D-MMCM package solution a very attractive and feasible candidate for millimeter-wave 3D system level package applications. It is a step towards achievement of 3D system level package meeting excellent millimeter-wave performance.
Keywords :
III-V semiconductors; gallium arsenide; micromechanical devices; millimetre wave circuits; multichip modules; silicon; wafer level packaging; 3D millimeter-wave multichip module package; 3D system level package; GaAs; MEMS process; MMCM package solution; Si; millimeter-wave 3D system level package applications; monolithic amplifier circuit; Costs; Electronics packaging; Integrated circuit interconnections; Integrated circuit packaging; MMICs; Micromechanical devices; Millimeter wave communication; Millimeter wave measurements; Millimeter wave radar; Millimeter wave technology; Amplifier; GaAs MMIC; MMCM; Millimeter-wave; System on package;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Millimeter Wave Technology (ICMMT), 2010 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-5705-2
Type :
conf
DOI :
10.1109/ICMMT.2010.5525098
Filename :
5525098
Link To Document :
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